Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant

EasyChair Preprint 15192, version history

Shu-Wen Li, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu and Chia-Tso Chao

Version	Date	Pages	Version notes
1	October 4, 2024	5
2	October 6, 2024	5	Revise the abstract.

Keyphrases: Defective parts per million (DPPM), Geographical part average testing (GPAT), Good-die-in-bad-neighborhood (GDBN), Latent defect, neural network

BibTeX entry

BibTeX does not have the right entry for preprints. This is a hack for producing the correct reference:

@booklet{EasyChair:15192,
  author    = {Shu-Wen Li and Chia-Heng Yen and Shuo-Wen Chang and Ying-Hua Chu and Kai-Chiang Wu and Chia-Tso Chao},
  title     = {Wafer-View Defect-Pattern-Prominent GDBN Method Using MetaFormer Variant},
  howpublished = {EasyChair Preprint 15192},
  year      = {EasyChair, 2024}}